Ferroelectric composite thin films of x·C18A-HSBT/PVDF with different C18A-HSBT content (weight ratio of C18A-HSBTto PVDF, x=2.5%, 5%, 7.5%, 10%) were prepared by spin-coating method. The crystal structures of x·C18A-HSBT/PVDFthin films were analyzed by X-ray diffraction (XRD) measurements together with Fourier transform-infrared spectroscopy(FT-IR). The morphological studies of these samples were done via scanning electron microscopy (SEM). Experimental resultsdemonstrated that both β-phase of PVDF and the layered perovskite C18A-HSBT co-existed in the x·C18A-HSBT/PVDF thinfilm samples. With an increase of C18A-HSBT content in the x·C18A-HSBT/PVDF thin films, both the dielectric constant andsaturated polarizations were also increased. In addition, as the C18A-HSBT content increased, the leakage current density ofthe x·C18A-HSBT/PVDF thin films under the applied electric field was decreased.

Keywords: PVDF, C18A-HSBT, Ferroelectric composite films, Remnant polarization