Articles
  • Dielectric and structural properties of (Ca0.7Sr0.3)(Zr0.8Ti0.2)O3 ceramics 
  • Ye-Sol Yuna, Hong-Ki Kima, Seung-Hwan Leea, In-Ho Imb, Seon-Gi Baec and Young-Hie Leea*
  • a Dept. of Electronics Materials Engineering, Kwangwoon University, Seoul 139-701, Korea b Dept. of Electrical Engineering, Shin Ahnsan University, Ansan 425-732, Korea c Dept. of Electrical Engineering, Incheon National University, Incheon 406-772, Korea
Abstract
(Ca0.7Sr0.3)(Zr0.8Ti0.2)O-3 ceramics were fabricated on conventional mixed oxides method. The experimental results show that sintering temperature strongly affects the microstructure and dielectric properties of CSZT ceramics. The optimum sintering temperature was 1450 degrees C, exhibiting relatively high dielectric constants and quality factors in wide frequency ranges (51.7 and 1379) (at 1 MHz), (50.1 and 1328) (at 3.5 GHz). Also, CSZT ceramics sintered at 1450 degrees C meets C0G characteristic (+/- 30 ppm/degrees C, -55 degrees C similar to 125 degrees C). These results indicated that CSZT ceramics can be applied to materials for microwave ceramics.

Keywords: (Ca0.7Sr0.3)(Zr0.8Ti0.2)O-3; Dielectric properties; Sintering temperature; C0G characteristic

This Article

  • 2014; 15(4): 266-268

    Published on Aug 31, 2014