A combination of Cyclic Voltammetry (CV) and Electrochemical Quartz Crystal Microbalance (EQCM) has been used to study the effect of sulfamic acid as a complexing agent on the formation of Cu-Se compounds. The values of the equivalent atomic mass (M/z) grown at the gold EQCM sensor during electrodeposition at varying potentials and constant potentials were analyzed to understand the mechanism of the growing process. It was found that sulfamic acid does not affect so much the deposition of Cu in the absence of Se. However, when Cu and Se are present simultaneously, sulfamic acid causes and facilitates the formation of Cu-Se compounds. Furthermore, at a high concentration, sulfamic acid causes a mass-loss process, leading to a change of composition. A suitable concentration of sulfamic acid can be concerned from these studies.

Keywords: Cyclic voltammetry, EQCM, Cu-Se compounds, Electrodeposition, Thin films.