Articles
  • Processing and characterization of sol-gel deposited (100)-oriented CSBTi thick films on Pt (111)/Ti/SiO2/Si (100) substrate 
  • Feng-Qing Zhanga,b, Kang-Ning Suna,*, Su-Hua Fanc,*, Wei-Hub and Xue-Tao Yueb
  • a Key Laboratory for Liquid-Solid Structural Evolution and Processing of Materials, Ministry of Education, Shandong University, China; Engineering Ceramics Key Laboratory of Shandong Province, Jinan 250061, China b College of Material Science and Engineering, Shandong Jianzhu University, Jinan 250101, China c Shandong Women's University, Jinan 250300, China
Abstract
Predominantly (100)-oriented Ca0.4Sr0.6Bi4Ti4O15 (CSBTi) thick films were deposited on Pt (111)/Ti/SiO2/Si substrates using a novel powder-gel method combined with annealed procedure. In this method, surface-modified fine CSBTi crystalline particles are well dispersed in a sol-gel precursor solution to have an uniform slurry which is then spin-coated onto a substrate. The thick films were then annealed at 750 degrees C for the annealing times ranging from 0 h to 4 h. The film annealed for 2 h exhibits a well saturated hysteresis loop with a remanent polarization (P-r) of 28.7 mu C/cm(2), much larger than the reported values Furthermore, no discernible fatigue effect can be observed after 10(10) switching cycles.

Keywords: Thin films thickness; Ferroelectric materials; Sol-gels materials processing

This Article

  • 2014; 15(6): 469-473

    Published on Dec 31, 2014

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