Articles
  • Characterization of O2 ionosorption induced potential changing property of SnO2 nanowire with Kelvin force microscopy (KFM)
  • Jinhee Heo and Soonho Won*
  • Advanced Characterization and Analysis Department, Korea Institute of Materials Science (KIMS), Changwon 641-831, Korea
Abstract
We have employed Kelvin force microscopy (KFM) system to measure the potential change of a single SnO2 nanowire which had been synthesized on the Au thin film by a thermal process. By using the KFM probing technique, Rh coated conducting cantilever can approach a single SnO2 nanowire in nano scale and get the potential images with oscillating AC bias between Au electrode and cantilever. Also, during imaging the potential status, we controlled the concentration of oxygen in measuring chamber to change the ionosorption rate. From the results of such experiments, we verified that the surface potential as well as doping type of a single SnO2 nanowire could be changed by oxygen ionosorption.

Keywords: Tin-oxide (SnO2), nanowire, gas sensor, Conductive -AFM, Kelvin force microscopy (KFM)

This Article

  • 2012; 13(S2): 359-362

    Published on Nov 30, 2012

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